Reversing a 40-year-old paradigm, UPI offers a new form of patented local probe microscope. UPI creates and markets instruments that are easier to understand, use and adapt, allowing a multitude of measurements in different environments. By changing the paradigm of near-field measurement, UPI aims to become a major player in the sale, design and development of a new type of local probe microscope and fine measurement instruments.

With this new technique, UPI wishes to extend the use of local probe microscopy to research fields not yet converted to this powerful technique. Its simplicity of operation will be a great tool for education. Finally, its versatility will allow it to be integrated into much larger assembly lines such as in microelectronics.